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Test
System
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The
Test System is composed of 5 main components:
- National
Instruments PXI Data Acquisition system that performs system
control and all data acquisition functions
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Larson Automation Custom Interface. This performs the electrical
interface from the DUT to the instrumentation
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Equipment Rack. This houses all the GPIB test equipment, RF
components, DUT interface, and the computer monitor
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RF
switching and routing. This routes all the different high frequency
and base-band signals to and from the various test equipment
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Custom Software. This ties the system together and provides
the user a single 'Virtual Instrument' to perform testing and
evaluation.

PXI
Data Acquisition System
The PXI data acquisition system contains the system controller
as well as modules for controlling instrumentation and performing
data acquisition and control.
- NI
PXI-8176 controller: using the embedded controller with a PXI
chassis, we build up a compact, high-performance PC platform
for modular instrumentation.
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Full 132 Mbytes/s PCI bandwidth; internal PXI trigger bus
routing
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512 MB SDRAM with upgrades
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512 KB advanced transfer cache, maximum
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1.26 GHz Pentium III processor o Additional extended I/O
interface, such as GPIB and RS-232
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NI PXI-6508 DIO module provides 96 5V TTL/CMOS digital I/O lines
for computers. It is utilized for DUT communication and control
purpose.
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96 static digital I/O lines (5 V/TTL) in 8-bit ports
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2-wire handshake capability
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Known power-up states
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Unidirectional and bidirectional I/O
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NI PXI-6070E MIO module provides the analog signal I/O. We use
it for digital signal TTL level controls and sensor monitoring
such as temperature, power, and etc.
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2 analog outputs; 8 digital I/O lines; two 24-bit counters;
analog triggering
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NI-DAQ driver software to simplify configuration and measurements
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NIST-traceable calibration certificate and more than 70
signal conditioning options
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NI PXI-5112 oscilloscope module. This oscilloscope is suitable
for collect the base band signals from I/Q ports of the DUT
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2 channels, simultaneously sampled
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100 MS/s per channel real-time sampling
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2.5 GS/s random interleaved sampling
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100 MHz bandwidth
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8-bit vertical resolution
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Waveform memory -- 16 or 32 million samples per channel;
multiple records up to 65,536 waveforms
Larson
Automation Custom Fixture
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Mechanical
- Designed to provide a quick and accurate interface
to the DUT through a 68 pin PCMCIA style connector
and six quick disconnect RF connectors
- DUT is fully exposed to allow probing for troubleshooting
and engineering experiments
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Electrical
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Custom Interface Boards (CIBs) provide the interface
between the DUT and the instrumentation for control
and monitor purposes
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Level shifters translate signals from DUT 3.3v to
TTL levels used by test equipment
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Provide high speed burst to communicate to the DUT
at up to 80 MHz
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Route digital control lines used to program the DUT
SPI interface, set the synthesizer to different
carrier channels, frequency bands, and gain levels.
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Analog sensor monitor to monitor detected power
level, temperature, and current consumption through
shunt resistors
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Route the 10 MHz reference signal between the test
equipment and reference for the DUT to support
different modes of testing
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Drive the 28V power for the noise source
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Manage and generate trigger signals for the spectrum
analyzer and the digitizer to support various measurements
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Drive LEDs on the front panel to provide operator
status of DC power
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RF
Switching and Routing
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Route input signals from the signal generator's RF port,
I/Q ports, or Noise Source.
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Route out signals to spectrum analyzer, oscilloscope
card, or power meter.
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Route the testing path into 3 individual channels on
the DUT.
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Convert the differential I&Q signals to coaxial single-ended
50? signals to interface with standard RF equipment
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Convert the coaxial single-ended 50? signals from the
test equipment to differential I&Q signals feed the
DUT
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High quality shielded cables protect signal loss and
distortion at high frequencies
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Power sensor performs the 'self-calibration' on RF path
during testing. This allows the operator to dynamically
change test conditions without worrying about stored
calibration tables
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Splitters, mixers, and filters to condition signals
and route to different locations
- RF switch matrix provides high-quality microwave
switch working at 5GHz frequency band. Long relay life
expectancy is up to 1 million times. Easily removable
switches allow reduced mean time to repair during the
maintenance.
- Microwave switches from DC to 6GHz.
- Female stainless steel SMA connectors.
- Compact, self-contained, light weight enclosure.
- GPIB programmable with SCPI command.
- Quiet, efficient, built-in power supply.
- Ten SP6T RF Switches
- Six SPDT RF Switches

Transmission
and Reception Switching Control
The
test system simulates a closed signal traversal path,
transmission and reception paths. The switching path control
utility is designed for application level and instrument driver
level. Switching path panel reflects the RF design diagram for
user to build up the RF testing path. Ascor switch driver panel
provides the access to each individual port of every individual
switch unit.
On
the transmission path, a source generates base band
signal, feeding into the wireless product. After the
frequency conversion, modulation, and signal processing,
the product transmits a high-frequency modulated RF
signal to an analyzer, which checks the processing quality



On
the reception path, the source generates RF modulated signal.
The product takes the signal as input, with the frequency
down-conversion, demodulation and signal process, and sends it
into the analyzer to check base band signal feature.



The
design also provides plenty of intermediate testing points.
The signal monitoring paths are convenient to check signal
quality after each signal process.
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Larson Automation
Inc.
Address: 960 Rincon Circle, San Jose, CA 95131
Tel: (408) 432-4800 Fax: (408) 432-4848 Email: info@larsonautomation.com
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