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Receiver Test
  • Receiver Gain
    • Measure the different gain levels from 20dB to 76dB cross multiple frequency spans
  • Receiver IIP3
    • Determine the effective IIP3 for an adjacent channel input signal at both the in-band and an out-of-band signal
  • Receiver Notch
    • Measure the signal clarity on the OFDM waveforms with four adjacent tones removed over the entire spread carrier span
  • Receiver Noise Figure
    • Utilize the Y-factor algorithm to measure the noise figure
  • Receiver Spurious
    • Detect and record all the unexpected spurious signals crossing a wide span
  • Receiver Adjacent Channel
    • Monitor the interferences from the adjacent frequency channels
  • Receiver Image Rejection
    • Determine the amount of image rejection achieved by the various products
  • Receiver Switching Time
    • Measure the time it takes for the RF circuitry to settle after switching from the TX State to the RX state
  • Receiver I/Q Imbalance
    • Determine the imbalance between the I path and the Q path of the receiver
  • Receiver DC Offset
    • Simulate the static DC offset calibration procedure used by the base band chip in a fully integrated system
  • Receiver Isolation
    • Determine the amount of isolation between the three RX channels on the chipset designs
  • Receiver Saturation Recovery
    • Measure the time required for the RX circuitry to recover from saturation
  • Receiver Baseband Filter
    • Measure the internal baseband filter attenuation profile for output signal
  • Receiver IF Filter
    • Measure the internal IF filter attenuation profile for down-conversion signal

Transmitter Tests

  • Transmitter Output Power
    • Measure the different output amplification levels from 0dB to 20dB
  • Transmitter Noise Figure
    • Utilize the Y-factor algorithm to measure the noise figure
  • Transmitter P-1dB Compression
    • Perform the P-1dB compression measurement
  • Transmitter Notch
    • Measure the signal clarity on the OFDM waveforms with four adjacent tones removed over the entire spread carrier span
  • Transmitter Spurious
    • Detect and record all the unexpected spurious signals crossing a wide span, and measure the RF image rejection signals and LO leakage signals
  • Transmitter Switching Time
    • Measure them time it takes fro the RF circuitry to settle after switching from the RX state to the TX state
  • Transmitter I/Q Imbalance
    • Determine the imbalance between the I path and the Q path of the transimtter
  • Transmitter Power Monitoring
    • Compare the actual power level with the register record power level
  • Transmitter Spectral Regrowth
    • Check the mask envelope shape for different modulation schemes, such as QAM64, CCK, QPSK, and etc

Miscellaneous Tests

  • Current Drain
    • Measure the drained current on the entire chipset and individual chips
  • Temperature Sense
    • Measure the temperature sensor register reflecting to the actual environment temperature changes
  • Phase Noise
    • Perform phase noise measurement on both receiver and transmitter
  • SPI Interface
    • Verify that the SPI digital control interface works properly over temperature and I/Q voltage ranges.
  • Reference Clock
    • Characterize the reference clock output. Measure the clock voltage level, temperature stability, and spectral purity.

 

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Larson Automation Inc.
Address: 960 Rincon Circle, San Jose, CA 95131
Tel: (408) 432-4800  Fax: (408) 432-4848  Email: info@larsonautomation.com

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