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Test
Description
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Receiver Test
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Receiver Gain
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Measure the different gain levels from 20dB to 76dB cross
multiple frequency spans
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Receiver IIP3
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Determine the effective IIP3 for an adjacent channel input
signal at both the in-band and an out-of-band signal
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Receiver Notch
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Measure the signal clarity on the OFDM waveforms with
four adjacent tones removed over the entire spread carrier
span
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Receiver Noise Figure
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Utilize the Y-factor algorithm to measure the noise figure
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Receiver Spurious
- Detect
and record all the unexpected spurious signals crossing
a wide span
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Receiver Adjacent Channel
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Monitor the interferences from the adjacent frequency
channels
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Receiver Image Rejection
- Determine
the amount of image rejection achieved by the various
products
- Receiver
Switching Time
- Measure
the time it takes for the RF circuitry to settle after
switching from the TX State to the RX state
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Receiver I/Q Imbalance
- Determine
the imbalance between the I path and the Q path of the
receiver
- Receiver
DC Offset
- Simulate
the static DC offset calibration procedure used by the
base band chip in a fully integrated system
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Receiver Isolation
- Determine
the amount of isolation between the three RX channels
on the chipset designs
- Receiver
Saturation Recovery
- Measure
the time required for the RX circuitry to recover from
saturation
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Receiver Baseband Filter
- Measure
the internal baseband filter attenuation profile for output
signal
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Receiver IF Filter
- Measure
the internal IF filter attenuation profile for down-conversion
signal
Transmitter
Tests
- Transmitter Output Power
- Measure the different output amplification levels from
0dB to 20dB
- Transmitter Noise Figure
- Utilize the Y-factor algorithm to measure the noise
figure
- Transmitter P-1dB Compression
- Perform the P-1dB compression measurement
- Transmitter Notch
- Measure the signal clarity on the OFDM waveforms with
four adjacent tones removed over the entire spread carrier
span
- Transmitter Spurious
- Detect and record all the unexpected spurious signals
crossing a wide span, and measure the RF image rejection
signals and LO leakage signals
- Transmitter Switching Time
- Measure them time it takes fro the RF circuitry to settle
after switching from the RX state to the TX state
- Transmitter I/Q Imbalance
- Determine the imbalance between the I path and the Q
path of the transimtter
- Transmitter Power Monitoring
- Compare the actual power level with the register record
power level
- Transmitter Spectral Regrowth
- Check the mask envelope shape for different modulation
schemes, such as QAM64, CCK, QPSK, and etc
Miscellaneous
Tests
- Current Drain
- Measure the drained current on the entire chipset and
individual chips
- Temperature Sense
- Measure the temperature sensor register reflecting to
the actual environment temperature changes
- Phase Noise
- Perform phase noise measurement on both receiver and
transmitter
- SPI Interface
- Verify that the SPI digital control interface works
properly over temperature and I/Q voltage ranges.
- Reference Clock
- Characterize the reference clock output. Measure the
clock voltage level, temperature stability, and spectral
purity.
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Larson Automation
Inc.
Address: 960 Rincon Circle, San Jose, CA 95131
Tel: (408) 432-4800 Fax: (408) 432-4848 Email: info@larsonautomation.com
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