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Test
System
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The
Test System is composed of 4 main components:
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- National
Instruments PXI Data Acquisition system that performs
system control and all data acquisition functions
- Larson
Automation custom fixture. This performs mechanical
and electrical interface from the DUT to the instrumentation
- Equipment
rack. This houses all the GPIB test equipment, fixture,
and computer monitor
- Custom
Software. This ties the system together and provides
the user a single "Virtual Instrument" to perform testing
of the G100 RF board
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PXI
Data Acquisition System
The PXI data acquisition system contains the system controller
as well as modules for controlling instrumentation and performing
data acquisition and control.

- NI-PXI-8174 controller
- USB communications with the DUT
- Serial port communications / monitor of DUT
- Program storage
- Data storage
- User interface
- NI PXI-5660 RF Signal Analyzer
- Capture the RF signals from the DUT to perform measurements
of the transmitter
- NI PXI-6508 Digital I/O module
- Provides 96 bits of digital Input or Output (I/O) configurable
in eight bit ports.
- Drives the custom interface circuitry to control and
monitor digital signals on the DUT
- Drives the RF switches
- Selects frequency counter inputs
- NI PXI-6070E Multi I/O module
- Provides 16 12-bit analog input channels and two 12-bit
analog output channels operating up to 1.25 MS/s
- Monitor current consumption
- Monitor FM demodulation signal and perform SINAD measurements
- Provide a pattern to FM modulate the signal generator
to support BER testing (see details) and Packet Detection
testing (see details)
- NI PXI-8212 GPIB Card and Ethernet
- Provides remote control of the traditional instrumentation
including power supply, signal generator, and frequency
counter
- Network communication
Larson
Automation Custom Fixture
The
custom fixture provides the mechanical, electrical, and RF interface
to the DUT.
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- Mechanical
- Designed to provide a quick and accurate interface
to the DUT utilizing an RF probe to access the antenna
and pins to interface to test points
- Tooling pins ensure proper and consistent alignmenn
- Mechanically assisted mechanism to provide a smooth
operation over many cycles minimizing operator strain
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- Electrical
- Custom Interface Boards (CIBs) route signals
to and from the instrumentation
- Analog Interface Board (CIB1)
- Route onboard voltages to the MIO card for
current measurements and other analog measurements
- Route and condition analog output signals
from the analog output DAQ interface to the
FM demodulation input of the signal generator
to support BER testing and pattern detection
testing
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Larson Automation
Inc.
Address: 960 Rincon Circle, San Jose, CA 95131
Tel: (408) 432-4800 Fax: (408) 432-4848 Email: info@larsonautomation.com
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